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IMA™ EL

Perfectly suited for the analysis of photovoltaic cells and semiconductors, IMA™ EL is a fast hyperspectral microscope for electroluminescence characterization of materials.

 

CHARACTERISTICS

  • Fast global mapping (non scanning)
  • High spatial and spectral resolution
  • Complete system (source, microscope, camera, filter, software)
  • Non-destructive analysis
  • Customization available

 

 

 

Applications

PHOTOVOLTAIC

IMA EL provides spectrally and spatially resolved electroluminescence images. It was successfully used to investigate spatial distribution of optoelectronic properties of CIS, CIGS, GaAs and perovskite solar cells.

DEFECTS ON SiC

IMA EL, Photon etc. hyperspectral imager allows a rapid and accurate identification of the class of defects that contributes to the green emission in 4H-SiC.

VIDEO

Silicon Carbide Defect Characterization

This video shows various types of defects in SiC  that are easily detected using  Photon etc’s luminescence imaging system. Offering spectrally resolved images, Photon etc’s hyperspectral imaging technology improves material development capacities.